A Deterministic Limit for Laser-Induced Damage: Deriving the Critical Plasma Seed Radius via Dielectric Carrier Relaxation

Fuente: Zenodo

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Bibliographic Details
Main Author:	John Drayton
Format:	Recurso digital
Published:	Zenodo 2026
Subjects:	High-Energy Optics Laser-Induced Damage Threshold (LIDT) Nonlinear Optics Avalanche Ionization Multi-Photon Absorption ISO 21254 Standard Carrier Dynamics Active Optical Telemetry (AOT)
Online Access:	Acceder al recurso
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