K16 Kill Condition Pre-Registration: Spontaneous Channel Capacity Increase — Empirical Replication
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| Format: | Recurso digital |
| Language: | English |
| Published: |
Zenodo
2026
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| _version_ | 1866901066242588672 |
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| author | Eckert, Anthony |
| author_facet | Eckert, Anthony |
| contents | **KEYWORDS:** void framework, kill condition, pre-registration, channel capacity, entropy production, second law, spontaneous Pe reduction, empirical replication, falsification **Filed:** 2026-03-02 **Framework:** Void Framework, Kill Condition K16 |
| format | Recurso digital |
| id | zenodo_https___doi_org_10_5281_zenodo_18839731 |
| institution | Zenodo |
| language | eng |
| publishDate | 2026 |
| publisher | Zenodo |
| record_format | zenodo |
| spellingShingle | K16 Kill Condition Pre-Registration: Spontaneous Channel Capacity Increase — Empirical Replication Eckert, Anthony void framework pre-registration falsification moreright **KEYWORDS:** void framework, kill condition, pre-registration, channel capacity, entropy production, second law, spontaneous Pe reduction, empirical replication, falsification **Filed:** 2026-03-02 **Framework:** Void Framework, Kill Condition K16 |
| title | K16 Kill Condition Pre-Registration: Spontaneous Channel Capacity Increase — Empirical Replication |
| topic | void framework pre-registration falsification moreright |
| url | https://doi.org/10.5281/zenodo.18839731 |