APA (7th ed.) Citation

IFTIKHAR, L. (2026). Radiation-Induced Reliability Degradation in Semiconductor Devices Used in Nuclear Reactor Instrumentation: A Review. Zenodo.

Chicago Style (17th ed.) Citation

IFTIKHAR, LAIBA. Radiation-Induced Reliability Degradation in Semiconductor Devices Used in Nuclear Reactor Instrumentation: A Review. Zenodo, 2026.

MLA (9th ed.) Citation

IFTIKHAR, LAIBA. Radiation-Induced Reliability Degradation in Semiconductor Devices Used in Nuclear Reactor Instrumentation: A Review. Zenodo, 2026.

Warning: These citations may not always be 100% accurate.