IFTIKHAR, L. (2026). Radiation-Induced Reliability Degradation in Semiconductor Devices Used in Nuclear Reactor Instrumentation: A Review. Zenodo.
Citazione stile Chigago Style (17a edizione)IFTIKHAR, LAIBA. Radiation-Induced Reliability Degradation in Semiconductor Devices Used in Nuclear Reactor Instrumentation: A Review. Zenodo, 2026.
Citatione MLA (9a ed.)IFTIKHAR, LAIBA. Radiation-Induced Reliability Degradation in Semiconductor Devices Used in Nuclear Reactor Instrumentation: A Review. Zenodo, 2026.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.