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| Natura: | Recurso digital |
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Zenodo
2026
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| Accesso online: | https://doi.org/10.5281/zenodo.18929134 |
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| _version_ | 1866901198094729216 |
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| author | IFTIKHAR, LAIBA |
| author_facet | IFTIKHAR, LAIBA |
| contents | <p>Semiconductor electronics play a major role in the monitoring and control of critical reactor <br>parameters in nuclear reactor instrumentation systems. Nevertheless, these devices function in <br>high-radiation settings where exposure to neutrons, gamma rays, and mixed-field radiation can <br>eventually impair device performance. The dependability deterioration caused by radiation in <br>semiconductor devices used in nuclear reactor equipment is comprehensively examined in this <br>paper. It discusses damage mechanisms, such as displacement damage and total ionising dose <br>(TID) effects, and looks at how they affect signal processing circuits, amplifiers, and sensors. <br>Additionally addressed are a number of hardening and dependability options, including <br>radiation-hardened-by-design (RHBD) approaches, shielding techniques, and redundancy <br>methods. The study concludes by pointing out research gaps and highlighting new avenues for <br>enhancing electronics' long-term performance and safety in nuclear reactor settings. This work <br>gathers current knowledge in the subject and can be used as a reference by researchers and <br>engineers involved in the design and maintenance of nuclear reactor monitoring systems. </p> |
| format | Recurso digital |
| id | zenodo_https___doi_org_10_5281_zenodo_18929134 |
| institution | Zenodo |
| language | |
| publishDate | 2026 |
| publisher | Zenodo |
| record_format | zenodo |
| spellingShingle | Radiation-Induced Reliability Degradation in Semiconductor Devices Used in Nuclear Reactor Instrumentation: A Review IFTIKHAR, LAIBA Affect/radiation effects Nuclear reactor instrumentation Semiconductor devices Total ionizing dose (TID) Displacement damage Radiation-hardened electronics <p>Semiconductor electronics play a major role in the monitoring and control of critical reactor <br>parameters in nuclear reactor instrumentation systems. Nevertheless, these devices function in <br>high-radiation settings where exposure to neutrons, gamma rays, and mixed-field radiation can <br>eventually impair device performance. The dependability deterioration caused by radiation in <br>semiconductor devices used in nuclear reactor equipment is comprehensively examined in this <br>paper. It discusses damage mechanisms, such as displacement damage and total ionising dose <br>(TID) effects, and looks at how they affect signal processing circuits, amplifiers, and sensors. <br>Additionally addressed are a number of hardening and dependability options, including <br>radiation-hardened-by-design (RHBD) approaches, shielding techniques, and redundancy <br>methods. The study concludes by pointing out research gaps and highlighting new avenues for <br>enhancing electronics' long-term performance and safety in nuclear reactor settings. This work <br>gathers current knowledge in the subject and can be used as a reference by researchers and <br>engineers involved in the design and maintenance of nuclear reactor monitoring systems. </p> |
| title | Radiation-Induced Reliability Degradation in Semiconductor Devices Used in Nuclear Reactor Instrumentation: A Review |
| topic | Affect/radiation effects Nuclear reactor instrumentation Semiconductor devices Total ionizing dose (TID) Displacement damage Radiation-hardened electronics |
| url | https://doi.org/10.5281/zenodo.18929134 |