Accelerated Life Testing Strategies for Competing Risks under Linear Degradation and Tampered Failure Rates

Fuente: Zenodo

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Bibliographic Details
Main Authors:	Dr. Fatemeh Rouhani, Dr. Parisa Jafari, Dr. Vladimir Kuznetsov
Format:	Recurso digital
Published:	Zenodo 2024
Subjects:	Expectation-maximization (EM) algorithm cause of failure intensity linear degradation path masked data reliability function.
Online Access:	Acceder al recurso
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