Characterisation of SN Persistence via Residual--Defect Comparability

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Bibliographic Details
Main Author: McGeough, Fiona
Format: Recurso digital
Published: Zenodo 2026
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author McGeough, Fiona
author_facet McGeough, Fiona
contents <p>Characterisation of SN Persistence via Residual--Defect Comparability</p>
format Recurso digital
id zenodo_https___doi_org_10_5281_zenodo_19768304
institution Zenodo
language
publishDate 2026
publisher Zenodo
record_format zenodo
spellingShingle Characterisation of SN Persistence via Residual--Defect Comparability
McGeough, Fiona
<p>Characterisation of SN Persistence via Residual--Defect Comparability</p>
title Characterisation of SN Persistence via Residual--Defect Comparability
url https://doi.org/10.5281/zenodo.19768304