Skip to content
Descubridor Institucional UMAR
Inicio
Búsqueda avanzada
Explorar
Inicio
Búsqueda avanzada
Explorar
Login
Language
English
Deutsch
Español
Français
Italiano
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
CMI_Brand5_220F_2_min10C_0k_EDLC_single
CMI_Brand5_220F_2_min10C_0k_EDLC_single
Fuente:
Zenodo
Saved in:
Bibliographic Details
Main Authors:
Kučera, Jan
,
Bartova, Lucie
,
Medina Rodriguez, Ana Lucia
,
Kozhukhar, Igor
Format:
Recurso digital
Published:
Zenodo
2026
Online Access:
Acceder al recurso
Tags:
Add Tag
No Tags, Be the first to tag this record!
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Save to List
Permanent link
Holdings
Description
Comments
Similar Items
Staff View
Description
Description not available.
Similar Items
INRIM_Brand1_25F_2_min10C_0k_EDLC_single
by: Zucca, Mauro, et al.
Published: (2026)
A PRISMA-driven systematic review of data mining methods used for defects detection and classification in the manufacturing industry
by: Blanka Bártová
Published: (2022)
INRIM_Brand2_90F_4_23C_0k_Hybrid_Module
by: Zucca, Mauro, et al.
Published: (2026)
INRIM_Brand2_90F_4_23C_0k_Hybrid_Module
by: Zucca, Mauro, et al.
Published: (2026)
INRIM_Brand2_90F_1_23C_0k_Hybrid_Module
by: Zucca, Mauro, et al.
Published: (2026)