Risultati della ricerca - Curson, Neil

Spatially resolved dielectric loss at the Si/SiO$_2$ interface di Cowie, Megan, Stock, Taylor J. Z., Constantinou, Procopios C., Curson, Neil, Grütter, Peter

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Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interface di Cowie, Megan, Constantinou, Procopios C., Curson, Neil J., Stock, Taylor J. Z., Grutter, Peter

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Generative Image Restoration and Super-Resolution using Physics-Informed Synthetic Data for Scanning Tunneling Microscopy di Kolev, Nikola L., Rodani, Tommaso, Curson, Neil J., Stock, Taylor J. Z., Cazzaniga, Alberto

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Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy di Bustamante, José, Miyahara, Yoichi, Fairgrieve-Park, Logan, Spruce, Kieran, See, Patrick, Curson, Neil, Stock, Taylor, Grutter, Peter

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Overcoming Data Scarcity in Scanning Tunnelling Microscopy Image Segmentation di Kolev, Nikola L., Trouton, Max, Canova, Filippo Federici, Thornton, Geoff, Gao, David Z., Curson, Neil J., Stock, Taylor J. Z.

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Imaging the Acceptor Wave Function Anisotropy in Silicon di Siegl, Manuel, Zanon, Julian, Sink, Joseph, da Cruz, Adonai Rodrigues, Hedgeland, Holly, Curson, Neil J., Flatté, Michael E., Schofield, Steven R.

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Hydrogen Passivation Effects on Spatially Resolved Charge Trap Densities in Si(100)-SiO$_2$ di Czarnecki, Adam J., Kolev, Nikola L., See, Patrick, Sullivan, Nick, Behn, Wyatt A., Curson, Neil J., Stock, Taylor J. Z., Grütter, Peter

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Strong electron-electron interactions in a dilute weakly-localized metal near a metal-to-insulator transition di D'Anna, Nicolò, Bragg, Jamie, McConnell, Aidan G., Vonka, Jakub, Constantinou, Procopios C., Li, Juerong, Stock, Taylor J. Z., Schofield, Steven R., Curson, Neil J., Soh, Y., Bartkowiak, Marek, Gerber, Simon, Müller, Markus, Matmon, Guy, Aeppli, Gabriel

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Element-specific, non-destructive profiling of layered heterostructures di D'Anna, Nicolò, Bragg, Jamie, Skoropata, Elizabeth, Hernández, Nazareth Ortiz, McConnell, Aidan G., Clémence, Maël, Ueda, Hiroki, Constantinou, Procopios C., Spruce, Kieran, Stock, Taylor J. Z., Fearn, Sarah, Schofield, Steven R., Curson, Neil J., Sanchez, Dario Ferreira, Grolimund, Daniel, Staub, Urs, Matmon, Guy, Gerber, Simon, Aeppli, Gabriel

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Roadmap on Atomic-scale Semiconductor Devices di Schofield, Steven R., Fisher, Andrew J., Ginossar, Eran, Lyding, Joseph W., Silver, Richard, Fei, Fan, Namboodiri, Pradeep, Wyrick, Jonathan, Masteghin, M. G., Cox, D. C., Murdin, B. N., Clowes, S. K, Keizer, Joris G., Simmons, Michelle Y., Stemp, Holly G., Morello, Andrea, Voisin, Benoit, Rogge, Sven, Wolkow, Robert A., Livadaru, Lucian, Pitters, Jason, Stock, Taylor J. Z., Curson, Neil J., Butera, Robert E., Pavlova, Tatiana V., Jakob, A. M., Spemann, D., Räcke, P., Schmidt-Kaler, F., Jamieson, D. N., Pratiush, Utkarsh, Duscher, Gerd, Kalinin, Sergei V., Kazazis, Dimitrios, Constantinou, Procopios, Aeppli, Gabriel, Ekinci, Yasin, Owen, James H. G., Fowler, Emma, Moheimani, S. O. Reza, Randall, John N., Misra, Shashank, Ivie, Jeffrey, Allemang, Christopher R., Anderson, Evan M., Bussmann, Ezra, Campbell, Quinn, Gao, Xujiao, Lu, Tzu-Ming, Schmucker, Scott W.

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