Suchergebnisse - Edwards, Josh

Imaging topological polar structures in marginally twisted 2D semiconductors Autoría: Vu, Thi-Hai-Yen, Bennett, Daniel, Pallewella, Gayani Nadeera, Maniatis, Johnathon, Edwards, Josh, Uddin, Md Hemayet, Xing, Kaijian, Resendiz-Vazquez, Pablo, Lee, Seng Huat, Mao, Zhiqiang, Muir, Jack B., Jia, Linnan, Davis, Jeffrey A., Watanabe, Kenji, Taniguchi, Takashi, Adam, Shaffique, Sharma, Pankaj, Fuhrer, Michael S., Edmonds, Mark T.