Suchergebnisse - Gupteswar Samal

Depth profile study of LaAl 1‐x Cr x O 3 /SrTiO 3 ( x  = 0, 0.2, 0.6, and 1) using time of flight secondary ion mass spectrometry (TOF‐SIMS) Autoría: Manas Kumar Dalai, Gupteswar Samal, Trupti R. Das, Pramod Kumar, Geetanjali Sehgal, Anjana Dogra