Search Results - Jun Hee Han

P‐53: Analysis of dead pixel origins and potential defect prediction using machine learning with tabular data Autoría: Jun Hee Han, Yoonseob Jeong, Minkyu Chun, Sang Won Yoon, Jeong-Hyeon Choi, Young Jun Choi, Young Mi Kim, Sang Hoon Jung, Joon-Young Yang, Sooyoung Yoon