Deng, S., Xiao, C., Yuan, J., Ma, D., Li, J., Yang, N., & He, H. (2019). Thermal Boundary Resistance Measurement and Analysis Across SiC/SiO2 Interface.
Style de citation Chicago (17e éd.)Deng, Shichen, Chengdi Xiao, Jiale Yuan, Dengke Ma, Junhui Li, Nuo Yang, et Hu He. Thermal Boundary Resistance Measurement and Analysis Across SiC/SiO2 Interface. 2019.
Style de citation MLA (9e éd.)Deng, Shichen, et al. Thermal Boundary Resistance Measurement and Analysis Across SiC/SiO2 Interface. 2019.
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