APA-Zitierstil (7. Ausg.)

Schlosser, T., Beuth, F., Friedrich, M., & Kowerko, D. (2019). A Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks.

Chicago-Zitierstil (17. Ausg.)

Schlosser, Tobias, Frederik Beuth, Michael Friedrich, und Danny Kowerko. A Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks. 2019.

MLA-Zitierstil (9. Ausg.)

Schlosser, Tobias, et al. A Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks. 2019.