Instrument for in situ hard x-ray nanobeam characterization during epitaxial crystallization and materials transformations

Fuente: arXiv
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Bibliographic Details
Main Authors: Marks, Samuel D., Quan, Peiyu, Liu, Rui, Highland, Matthew J., Zhou, Hua, Keuch, Thomas F., Stephenson, G. Brian, Evans, Paul G.
Format: Preprint
Published: 2020
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