APA (7th ed.) Citation

Perner, L. W., Truong, G., Follman, D., Prinz, M., Winkler, G., Puchegger, S., . . . Heckl, O. H. (2023). Simultaneous Measurement of Mid-Infrared Refractive Indices in Thin-Film Heterostructures: Methodology and Results for GaAs/AlGaAs.

Chicago Style (17th ed.) Citation

Perner, Lukas W., Gar-Wing Truong, David Follman, Maximilian Prinz, Georg Winkler, Stephan Puchegger, Garrett D. Cole, and Oliver H. Heckl. Simultaneous Measurement of Mid-Infrared Refractive Indices in Thin-Film Heterostructures: Methodology and Results for GaAs/AlGaAs. 2023.

MLA (9th ed.) Citation

Perner, Lukas W., et al. Simultaneous Measurement of Mid-Infrared Refractive Indices in Thin-Film Heterostructures: Methodology and Results for GaAs/AlGaAs. 2023.