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Main Authors: Belmoubarik, Mohamed, Al-Mahdawi, Muftah, Machado Jr., George, Nozaki, Tomohiro, Coelho, Cláudia, Sahashi, Masashi, Peng, Weng Kung
Format: Preprint
Published: 2023
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Online Access:https://arxiv.org/abs/2305.16563
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author Belmoubarik, Mohamed
Al-Mahdawi, Muftah
Machado Jr., George
Nozaki, Tomohiro
Coelho, Cláudia
Sahashi, Masashi
Peng, Weng Kung
author_facet Belmoubarik, Mohamed
Al-Mahdawi, Muftah
Machado Jr., George
Nozaki, Tomohiro
Coelho, Cláudia
Sahashi, Masashi
Peng, Weng Kung
contents Ferroelectric memristors have attracted much attention as a type of nonvolatile resistance switching memories in neuromorphic computing, image recognition, and information storage. Their resistance switching mechanisms have been studied several times in perovskite and complicated materials systems. It was interpreted as the modulation of carrier transport by polarization control over Schottky barriers. Here, we experimentally report the isothermal resistive switching across a CoPt/MgZnO Schottky barrier using a simple binary semiconductor. The crystal and texture properties showed high-quality and single-crystal Co$_{0.30}$Pt$_{0.70}$/Mg$_{0.20}$Zn$_{0.80}$O hetero-junctions. The resistive switching was examined by an electric-field cooling method that exhibited a ferroelectric T$_C$ of MgZnO close to the bulk value. The resistive switching across CoPt/MgZnO Schottky barrier was accompanied by a change in the Schottky barrier height of 26.5 meV due to an interfacial charge increase and/or orbital hybridization induced reversal of MgZnO polarization. The magnitude of the reversed polarization was estimated to be a reasonable value of 3.0 (8.25) $μ$ C/cm$^2$ at 300 K (2 K). These findings demonstrated the utilities of CoPt/MgZnO interface as a potential candidate for ferroelectric memristors and can be extended to probe the resistive switching of other hexagonal ferroelectric materials.
format Preprint
id arxiv_https___arxiv_org_abs_2305_16563
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Ferroelectricity driven-resistive switching and Schottky barrier modulation at CoPt/MgZnO interface for non-volatile memories
Belmoubarik, Mohamed
Al-Mahdawi, Muftah
Machado Jr., George
Nozaki, Tomohiro
Coelho, Cláudia
Sahashi, Masashi
Peng, Weng Kung
Materials Science
Ferroelectric memristors have attracted much attention as a type of nonvolatile resistance switching memories in neuromorphic computing, image recognition, and information storage. Their resistance switching mechanisms have been studied several times in perovskite and complicated materials systems. It was interpreted as the modulation of carrier transport by polarization control over Schottky barriers. Here, we experimentally report the isothermal resistive switching across a CoPt/MgZnO Schottky barrier using a simple binary semiconductor. The crystal and texture properties showed high-quality and single-crystal Co$_{0.30}$Pt$_{0.70}$/Mg$_{0.20}$Zn$_{0.80}$O hetero-junctions. The resistive switching was examined by an electric-field cooling method that exhibited a ferroelectric T$_C$ of MgZnO close to the bulk value. The resistive switching across CoPt/MgZnO Schottky barrier was accompanied by a change in the Schottky barrier height of 26.5 meV due to an interfacial charge increase and/or orbital hybridization induced reversal of MgZnO polarization. The magnitude of the reversed polarization was estimated to be a reasonable value of 3.0 (8.25) $μ$ C/cm$^2$ at 300 K (2 K). These findings demonstrated the utilities of CoPt/MgZnO interface as a potential candidate for ferroelectric memristors and can be extended to probe the resistive switching of other hexagonal ferroelectric materials.
title Ferroelectricity driven-resistive switching and Schottky barrier modulation at CoPt/MgZnO interface for non-volatile memories
topic Materials Science
url https://arxiv.org/abs/2305.16563