APA (7th ed.) Citation

Meyer, J. J., Khatri, S., França, D. S., Eisert, J., & Faist, P. (2023). Quantum metrology in the finite-sample regime.

Chicago Style (17th ed.) Citation

Meyer, Johannes Jakob, Sumeet Khatri, Daniel Stilck França, Jens Eisert, and Philippe Faist. Quantum Metrology in the Finite-sample Regime. 2023.

MLA (9th ed.) Citation

Meyer, Johannes Jakob, et al. Quantum Metrology in the Finite-sample Regime. 2023.