Ghosh, S., Liu, F., Nair, S., Jalan, B., & Mkhoyan, K. A. (2024). Site-Specific Plan-view (S)TEM Sample Preparation from Thin Films using a Dual-Beam FIB-SEM.
Chicago Style (17th ed.) CitationGhosh, Supriya, Fengdeng Liu, Sreejith Nair, Bharat Jalan, and K. Andre Mkhoyan. Site-Specific Plan-view (S)TEM Sample Preparation from Thin Films Using a Dual-Beam FIB-SEM. 2024.
MLA (9th ed.) CitationGhosh, Supriya, et al. Site-Specific Plan-view (S)TEM Sample Preparation from Thin Films Using a Dual-Beam FIB-SEM. 2024.
Warning: These citations may not always be 100% accurate.