Yao, Z., Xu, J., Hou, S., & Chuah, M. C. (2024). CrackNex: A Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections.
Cita Chicago Style (17a ed.)Yao, Zhen, Jiawei Xu, Shuhang Hou, y Mooi Choo Chuah. CrackNex: A Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections. 2024.
Cita MLA (9a ed.)Yao, Zhen, et al. CrackNex: A Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections. 2024.
Precaución: Estas citas no son 100% exactas.