Cita APA (7a ed.)

Yao, Z., Xu, J., Hou, S., & Chuah, M. C. (2024). CrackNex: A Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections.

Cita Chicago Style (17a ed.)

Yao, Zhen, Jiawei Xu, Shuhang Hou, y Mooi Choo Chuah. CrackNex: A Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections. 2024.

Cita MLA (9a ed.)

Yao, Zhen, et al. CrackNex: A Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections. 2024.

Precaución: Estas citas no son 100% exactas.