APA (7th ed.) Citation

Shen, J., Voss, L. F., & Varley, J. B. (2024). Simulating Charged Defects at Database Scale.

Chicago Style (17th ed.) Citation

Shen, Jimmy-Xuan, Lars F. Voss, and Joel Basile Varley. Simulating Charged Defects at Database Scale. 2024.

MLA (9th ed.) Citation

Shen, Jimmy-Xuan, et al. Simulating Charged Defects at Database Scale. 2024.