APA (7th ed.) Citation

Pant, N., Bushick, K., McAllister, A., Lee, W., Van de Walle, C. G., & Kioupakis, E. (2024). Carrier confinement and alloy disorder exacerbate Auger-Meitner recombination in AlGaN ultraviolet light-emitting diodes.

Chicago Style (17th ed.) Citation

Pant, Nick, Kyle Bushick, Andrew McAllister, Woncheol Lee, Chris G. Van de Walle, and Emmanouil Kioupakis. Carrier Confinement and Alloy Disorder Exacerbate Auger-Meitner Recombination in AlGaN Ultraviolet Light-emitting Diodes. 2024.

MLA (9th ed.) Citation

Pant, Nick, et al. Carrier Confinement and Alloy Disorder Exacerbate Auger-Meitner Recombination in AlGaN Ultraviolet Light-emitting Diodes. 2024.