Style de citation APA (7e éd.)

Singh, A., Lee, S., Bae, H., Koo, J., Yang, L., & Lee, H. (2024). Theoretical investigation of the vertical dielectric screening dependence on defects for few-layered van der Waals materials.

Style de citation Chicago (17e éd.)

Singh, Amit, Seunghan Lee, Hyeonhu Bae, Jahyun Koo, Li Yang, et Hoonkyung Lee. Theoretical Investigation of the Vertical Dielectric Screening Dependence on Defects for Few-layered Van Der Waals Materials. 2024.

Style de citation MLA (9e éd.)

Singh, Amit, et al. Theoretical Investigation of the Vertical Dielectric Screening Dependence on Defects for Few-layered Van Der Waals Materials. 2024.