Singh, A., Lee, S., Bae, H., Koo, J., Yang, L., & Lee, H. (2024). Theoretical investigation of the vertical dielectric screening dependence on defects for few-layered van der Waals materials.
Chicago-Zitierstil (17. Ausg.)Singh, Amit, Seunghan Lee, Hyeonhu Bae, Jahyun Koo, Li Yang, und Hoonkyung Lee. Theoretical Investigation of the Vertical Dielectric Screening Dependence on Defects for Few-layered Van Der Waals Materials. 2024.
MLA-Zitierstil (9. Ausg.)Singh, Amit, et al. Theoretical Investigation of the Vertical Dielectric Screening Dependence on Defects for Few-layered Van Der Waals Materials. 2024.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.