Guo, Y., Gao, X., & Jiang, B. (2024). An Empirical Study on JIT Defect Prediction Based on BERT-style Model.
Chicago Style (17th ed.) CitationGuo, Yuxiang, Xiaopeng Gao, and Bo Jiang. An Empirical Study on JIT Defect Prediction Based on BERT-style Model. 2024.
MLA (9th ed.) CitationGuo, Yuxiang, et al. An Empirical Study on JIT Defect Prediction Based on BERT-style Model. 2024.
Warning: These citations may not always be 100% accurate.