Guo, Y., Gao, X., & Jiang, B. (2024). An Empirical Study on JIT Defect Prediction Based on BERT-style Model.
Cita Chicago Style (17a ed.)Guo, Yuxiang, Xiaopeng Gao, y Bo Jiang. An Empirical Study on JIT Defect Prediction Based on BERT-style Model. 2024.
Cita MLA (9a ed.)Guo, Yuxiang, et al. An Empirical Study on JIT Defect Prediction Based on BERT-style Model. 2024.
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