APA (7th ed.) Citation

Laudari, A., Pathiranage, S., Thomas, S. A., Petersen, R. J., Anderson, K. J., Pringle, T. A., . . . Oncel, N. (2024). Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy.

Chicago Style (17th ed.) Citation

Laudari, Amrit, Sameera Pathiranage, Salim A. Thomas, Reed J. Petersen, Kenneth J. Anderson, Todd A. Pringle, Erik K. Hobbie, and Nuri Oncel. Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy. 2024.

MLA (9th ed.) Citation

Laudari, Amrit, et al. Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy. 2024.