Laudari, A., Pathiranage, S., Thomas, S. A., Petersen, R. J., Anderson, K. J., Pringle, T. A., . . . Oncel, N. (2024). Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy.
Citazione stile Chigago Style (17a edizione)Laudari, Amrit, Sameera Pathiranage, Salim A. Thomas, Reed J. Petersen, Kenneth J. Anderson, Todd A. Pringle, Erik K. Hobbie, e Nuri Oncel. Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy. 2024.
Citatione MLA (9a ed.)Laudari, Amrit, et al. Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy. 2024.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.