Tanksalvala, M., Porter, C. L., Esashi, Y., Wang, B., Jenkins, N. W., Zhang, Z., . . . Murnane, M. M. (2024). Non-Destructive, High-Resolution, Chemically Specific, 3D Nanostructure Characterization using Phase-Sensitive EUV Imaging Reflectometry.
Citazione stile Chigago Style (17a edizione)Tanksalvala, Michael, et al. Non-Destructive, High-Resolution, Chemically Specific, 3D Nanostructure Characterization Using Phase-Sensitive EUV Imaging Reflectometry. 2024.
Citatione MLA (9a ed.)Tanksalvala, Michael, et al. Non-Destructive, High-Resolution, Chemically Specific, 3D Nanostructure Characterization Using Phase-Sensitive EUV Imaging Reflectometry. 2024.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.