Fuchs, C., Fürst, L., Buhmann, H., Kleinlein, J., & Molenkamp, L. W. (2024). Overlapping Top Gate Electrodes based on Low Temperature Atomic Layer Deposition for Nanoscale Ambipolar Lateral Junctions.
Chicago Style (17th ed.) CitationFuchs, Christopher, Lena Fürst, Hartmut Buhmann, Johannes Kleinlein, and Laurens W. Molenkamp. Overlapping Top Gate Electrodes Based on Low Temperature Atomic Layer Deposition for Nanoscale Ambipolar Lateral Junctions. 2024.
MLA (9th ed.) CitationFuchs, Christopher, et al. Overlapping Top Gate Electrodes Based on Low Temperature Atomic Layer Deposition for Nanoscale Ambipolar Lateral Junctions. 2024.
Warning: These citations may not always be 100% accurate.