APA (7th ed.) Citation

Yoon, H., Keum, C., Witkowski, A., Ludzik, J., Petrie, T., Hanson, H. A., & Leachman, S. A. (2024). Enhancing Diagnosis through AI-driven Analysis of Reflectance Confocal Microscopy.

Chicago Style (17th ed.) Citation

Yoon, Hong-Jun, Chris Keum, Alexander Witkowski, Joanna Ludzik, Tracy Petrie, Heidi A. Hanson, and Sancy A. Leachman. Enhancing Diagnosis Through AI-driven Analysis of Reflectance Confocal Microscopy. 2024.

MLA (9th ed.) Citation

Yoon, Hong-Jun, et al. Enhancing Diagnosis Through AI-driven Analysis of Reflectance Confocal Microscopy. 2024.