Yoon, H., Keum, C., Witkowski, A., Ludzik, J., Petrie, T., Hanson, H. A., & Leachman, S. A. (2024). Enhancing Diagnosis through AI-driven Analysis of Reflectance Confocal Microscopy.
Style de citation Chicago (17e éd.)Yoon, Hong-Jun, Chris Keum, Alexander Witkowski, Joanna Ludzik, Tracy Petrie, Heidi A. Hanson, et Sancy A. Leachman. Enhancing Diagnosis Through AI-driven Analysis of Reflectance Confocal Microscopy. 2024.
Style de citation MLA (9e éd.)Yoon, Hong-Jun, et al. Enhancing Diagnosis Through AI-driven Analysis of Reflectance Confocal Microscopy. 2024.
Attention : ces citations peuvent ne pas être correctes à 100%.