APA (7th ed.) Citation

Cakar, E., Ercan, H. E., Fuchs, G., Denisov, A. O., Anderson, C. R., Gyure, M. F., & Petta, J. R. (2024). Towards Utilizing Scanning Gate Microscopy as a High-Resolution Probe of Valley Splitting in Si/SiGe Heterostructures.

Chicago Style (17th ed.) Citation

Cakar, Efe, H. Ekmel Ercan, Gordian Fuchs, Artem O. Denisov, Christopher R. Anderson, Mark F. Gyure, and Jason R. Petta. Towards Utilizing Scanning Gate Microscopy as a High-Resolution Probe of Valley Splitting in Si/SiGe Heterostructures. 2024.

MLA (9th ed.) Citation

Cakar, Efe, et al. Towards Utilizing Scanning Gate Microscopy as a High-Resolution Probe of Valley Splitting in Si/SiGe Heterostructures. 2024.