APA (7th ed.) Citation

Wu, H., Tian, S., Gutierrez, J., Bhatta, A., Öztürk, K., & Bowyer, K. W. (2024). Identity Overlap Between Face Recognition Train/Test Data: Causing Optimistic Bias in Accuracy Measurement.

Chicago Style (17th ed.) Citation

Wu, Haiyu, Sicong Tian, Jacob Gutierrez, Aman Bhatta, Kağan Öztürk, and Kevin W. Bowyer. Identity Overlap Between Face Recognition Train/Test Data: Causing Optimistic Bias in Accuracy Measurement. 2024.

MLA (9th ed.) Citation

Wu, Haiyu, et al. Identity Overlap Between Face Recognition Train/Test Data: Causing Optimistic Bias in Accuracy Measurement. 2024.