Cita APA (7a ed.)

Eckert, D., Syben, C., Hümmer, C., Ritschl, L., Kappler, S., & Stober, S. (2024). StyleX: A Trainable Metric for X-ray Style Distances.

Cita Chicago Style (17a ed.)

Eckert, Dominik, Christopher Syben, Christian Hümmer, Ludwig Ritschl, Steffen Kappler, y Sebastian Stober. StyleX: A Trainable Metric for X-ray Style Distances. 2024.

Cita MLA (9a ed.)

Eckert, Dominik, et al. StyleX: A Trainable Metric for X-ray Style Distances. 2024.