Cao, J., Guo, C., Li, H., Wang, Z., Wang, H., & Li, G. Y. (2024). Deep Learning based Performance Testing for Analog Integrated Circuits.
Chicago Style (17th ed.) CitationCao, Jiawei, Chongtao Guo, Hao Li, Zhigang Wang, Houjun Wang, and Geoffrey Ye Li. Deep Learning Based Performance Testing for Analog Integrated Circuits. 2024.
MLA (9th ed.) CitationCao, Jiawei, et al. Deep Learning Based Performance Testing for Analog Integrated Circuits. 2024.
Warning: These citations may not always be 100% accurate.