Cita APA (7a ed.)

Cao, J., Guo, C., Li, H., Wang, Z., Wang, H., & Li, G. Y. (2024). Deep Learning based Performance Testing for Analog Integrated Circuits.

Cita Chicago Style (17a ed.)

Cao, Jiawei, Chongtao Guo, Hao Li, Zhigang Wang, Houjun Wang, y Geoffrey Ye Li. Deep Learning Based Performance Testing for Analog Integrated Circuits. 2024.

Cita MLA (9a ed.)

Cao, Jiawei, et al. Deep Learning Based Performance Testing for Analog Integrated Circuits. 2024.