APA (7th ed.) Citation

Wei, J., Xu, Z., Shen, W., Feng, B., Ishikawa, R., Shibata, N., . . . Bai, X. (2024). Real-space tilting method for atomic resolution STEM imaging of nanocrystalline materials.

Chicago Style (17th ed.) Citation

Wei, Jiake, Zhangze Xu, Wenjie Shen, Bin Feng, Ryo Ishikawa, Naoya Shibata, Yuichi Ikuhara, and Xuedong Bai. Real-space Tilting Method for Atomic Resolution STEM Imaging of Nanocrystalline Materials. 2024.

MLA (9th ed.) Citation

Wei, Jiake, et al. Real-space Tilting Method for Atomic Resolution STEM Imaging of Nanocrystalline Materials. 2024.