Craig, I. M., Van Winkle, M., Ophus, C., & Bediako, D. K. (2024). Considerations for extracting moiré-level strain from dark field intensities in transmission electron microscopy.
Style de citation Chicago (17e éd.)Craig, Isaac M., Madeline Van Winkle, Colin Ophus, et D. Kwabena Bediako. Considerations for Extracting Moiré-level Strain from Dark Field Intensities in Transmission Electron Microscopy. 2024.
Style de citation MLA (9e éd.)Craig, Isaac M., et al. Considerations for Extracting Moiré-level Strain from Dark Field Intensities in Transmission Electron Microscopy. 2024.
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