Cita APA (7a ed.)

Lee, J., Agrawal, T., Uchendu, A., Le, T., Chen, J., & Lee, D. (2024). PlagBench: Exploring the Duality of Large Language Models in Plagiarism Generation and Detection.

Cita Chicago Style (17a ed.)

Lee, Jooyoung, Toshini Agrawal, Adaku Uchendu, Thai Le, Jinghui Chen, y Dongwon Lee. PlagBench: Exploring the Duality of Large Language Models in Plagiarism Generation and Detection. 2024.

Cita MLA (9a ed.)

Lee, Jooyoung, et al. PlagBench: Exploring the Duality of Large Language Models in Plagiarism Generation and Detection. 2024.