Citazione Stile APA (7a Edizione)

Habenschaden, C., Sievers, S., Klasen, A., Cerreta, A., & Schumacher, H. W. (2024). Magnetic Force Microscopy: High Quality-Factor Two-Pass Mode.

Citazione stile Chigago Style (17a edizione)

Habenschaden, Christopher, Sibylle Sievers, Alexander Klasen, Andrea Cerreta, e Hans Werner Schumacher. Magnetic Force Microscopy: High Quality-Factor Two-Pass Mode. 2024.

Citatione MLA (9a ed.)

Habenschaden, Christopher, et al. Magnetic Force Microscopy: High Quality-Factor Two-Pass Mode. 2024.