Reato, E., Esteki, A., Ku, B., Wang, Z., Heuken, M., Lemme, M. C., & Engström, O. (2024). Multiparameter admittance spectroscopy for investigating defects in MoS${_2}$ thin film MOSFETs.
Citazione stile Chigago Style (17a edizione)Reato, Eros, Ardeshir Esteki, Benny Ku, Zhenxing Wang, Michael Heuken, Max C. Lemme, e Olof Engström. Multiparameter Admittance Spectroscopy for Investigating Defects in MoS${_2}$ Thin Film MOSFETs. 2024.
Citatione MLA (9a ed.)Reato, Eros, et al. Multiparameter Admittance Spectroscopy for Investigating Defects in MoS${_2}$ Thin Film MOSFETs. 2024.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.