Fiorenza, P., Zignale, M., Zanetti, E., Alessandrino, M. S., Carbone, B., Guarnera, A., . . . Roccaforte, F. (2024). Complementary two dimensional carrier profiles of 4H-SiC MOSFETs by Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy.
Style de citation Chicago (17e éd.)Fiorenza, Patrick, Marco Zignale, Edoardo Zanetti, Mario S. Alessandrino, Beatrice Carbone, Alfio Guarnera, Mario Saggio, Filippo Giannazzo, et Fabrizio Roccaforte. Complementary Two Dimensional Carrier Profiles of 4H-SiC MOSFETs by Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy. 2024.
Style de citation MLA (9e éd.)Fiorenza, Patrick, et al. Complementary Two Dimensional Carrier Profiles of 4H-SiC MOSFETs by Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy. 2024.