Liu, B., Chen, D., & Qi, X. (2024). YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images.
Chicago Style (17th ed.) CitationLiu, Bowen, Dongjie Chen, and Xiao Qi. YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images. 2024.
MLA (9th ed.) CitationLiu, Bowen, et al. YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images. 2024.
Warning: These citations may not always be 100% accurate.