APA (7th ed.) Citation

Liu, B., Chen, D., & Qi, X. (2024). YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images.

Chicago Style (17th ed.) Citation

Liu, Bowen, Dongjie Chen, and Xiao Qi. YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images. 2024.

MLA (9th ed.) Citation

Liu, Bowen, et al. YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images. 2024.

Warning: These citations may not always be 100% accurate.