Abe, T., Shinozaki, M., Matsumura, K., Aizawa, T., Kumasaka, T., Ito, N., . . . Otsuka, T. (2024). Probing electron trapping by current collapse in GaN/AlGaN FETs utilizing quantum transport characteristics.
Citazione stile Chigago Style (17a edizione)Abe, Takaya, Motoya Shinozaki, Kazuma Matsumura, Takumi Aizawa, Takeshi Kumasaka, Norikazu Ito, Taketoshi Tanaka, Ken Nakahara, e Tomohiro Otsuka. Probing Electron Trapping by Current Collapse in GaN/AlGaN FETs Utilizing Quantum Transport Characteristics. 2024.
Citatione MLA (9a ed.)Abe, Takaya, et al. Probing Electron Trapping by Current Collapse in GaN/AlGaN FETs Utilizing Quantum Transport Characteristics. 2024.
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