APA (7th ed.) Citation

Roy, S., Bhattacharyya, A., Peterson, C., & Krishnamoorthy, S. (2024). Dielectric Reliability and Interface Trap Characterization in MOCVD grown In-situ Al$_2$O$_3$ on $β$-Ga$_2$O$_3$.

Chicago Style (17th ed.) Citation

Roy, Saurav, Arkka Bhattacharyya, Carl Peterson, and Sriram Krishnamoorthy. Dielectric Reliability and Interface Trap Characterization in MOCVD Grown In-situ Al$_2$O$_3$ on $β$-Ga$_2$O$_3$. 2024.

MLA (9th ed.) Citation

Roy, Saurav, et al. Dielectric Reliability and Interface Trap Characterization in MOCVD Grown In-situ Al$_2$O$_3$ on $β$-Ga$_2$O$_3$. 2024.