Hutiri, W., Patel, T., Ding, A. Y., & Scharenborg, O. (2024). As Biased as You Measure: Methodological Pitfalls of Bias Evaluations in Speaker Verification Research.
Cita Chicago Style (17a ed.)Hutiri, Wiebke, Tanvina Patel, Aaron Yi Ding, y Odette Scharenborg. As Biased as You Measure: Methodological Pitfalls of Bias Evaluations in Speaker Verification Research. 2024.
Cita MLA (9a ed.)Hutiri, Wiebke, et al. As Biased as You Measure: Methodological Pitfalls of Bias Evaluations in Speaker Verification Research. 2024.
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