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Main Authors: Atmane, Soumya, Alexandre, Maroussiak, Caillard, Amaël, Thomann, Anne-Lise, Kateb, Movaffaq, Gudmundsson, Jón Tómas, Brault, Pascal
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2409.01049
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author Atmane, Soumya
Alexandre, Maroussiak
Caillard, Amaël
Thomann, Anne-Lise
Kateb, Movaffaq
Gudmundsson, Jón Tómas
Brault, Pascal
author_facet Atmane, Soumya
Alexandre, Maroussiak
Caillard, Amaël
Thomann, Anne-Lise
Kateb, Movaffaq
Gudmundsson, Jón Tómas
Brault, Pascal
contents We present a comparative study of copper film growth with a constant energy neutral beam, thermal evaporation, dc magnetron sputtering, high-power impulse magnetron sputtering (HiP-IMS), and bipolar HiPIMS, through molecular dynamics simulations. Experimentally determined energy distribution functions were utilized to model the deposition processes. Our results indicate significant differences in the film quality, growth rate, and substrate erosion between the various physical vapor deposition techniques. Bipolar HiPIMS shows the potential for improved film structure under certain conditions, albeit with increased substrate erosion. Bipolar +180 V HiPIMS with 10% Cu + ions exhibited the best film properties in terms of crystallinity and atomic stress among the PVD processes investigated.
format Preprint
id arxiv_https___arxiv_org_abs_2409_01049
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle The role of sputtered atom and ion energy distribution in films deposited by Physical Vapor Deposition: A molecular dynamics approach
Atmane, Soumya
Alexandre, Maroussiak
Caillard, Amaël
Thomann, Anne-Lise
Kateb, Movaffaq
Gudmundsson, Jón Tómas
Brault, Pascal
Computational Physics
Plasma Physics
We present a comparative study of copper film growth with a constant energy neutral beam, thermal evaporation, dc magnetron sputtering, high-power impulse magnetron sputtering (HiP-IMS), and bipolar HiPIMS, through molecular dynamics simulations. Experimentally determined energy distribution functions were utilized to model the deposition processes. Our results indicate significant differences in the film quality, growth rate, and substrate erosion between the various physical vapor deposition techniques. Bipolar HiPIMS shows the potential for improved film structure under certain conditions, albeit with increased substrate erosion. Bipolar +180 V HiPIMS with 10% Cu + ions exhibited the best film properties in terms of crystallinity and atomic stress among the PVD processes investigated.
title The role of sputtered atom and ion energy distribution in films deposited by Physical Vapor Deposition: A molecular dynamics approach
topic Computational Physics
Plasma Physics
url https://arxiv.org/abs/2409.01049