APA-Zitierstil (7. Ausg.)

Yin, S., Cho, J., Feng, D., Mei, H., Kumar, T., Wan, C., . . . Kats, M. A. (2024). Preventing overfitting in infrared ellipsometry using temperature dependence: Fused silica as a case study.

Chicago-Zitierstil (17. Ausg.)

Yin, Shenwei, Jin-Woo Cho, Demeng Feng, Hongyan Mei, Tanuj Kumar, Chenghao Wan, Yeonghoon Jin, Minjeong Kim, und Mikhail A. Kats. Preventing Overfitting in Infrared Ellipsometry Using Temperature Dependence: Fused Silica as a Case Study. 2024.

MLA-Zitierstil (9. Ausg.)

Yin, Shenwei, et al. Preventing Overfitting in Infrared Ellipsometry Using Temperature Dependence: Fused Silica as a Case Study. 2024.