Style de citation APA (7e éd.)

Kuster, M., Hartmann, R., Hauf, S., Holl, P., Rüter, T., & Strüder, L. (2024). On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging.

Style de citation Chicago (17e éd.)

Kuster, Markus, Robert Hartmann, Steffen Hauf, Peter Holl, Tonn Rüter, et Lothar Strüder. On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging. 2024.

Style de citation MLA (9e éd.)

Kuster, Markus, et al. On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging. 2024.