APA (7th ed.) Citation

Bao, Y., Li, E., Yang, H., & Jia, B. (2024). Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network.

Chicago Style (17th ed.) Citation

Bao, Yin-Yin, Er-Chao Li, Hong-Qiang Yang, and Bin-Bin Jia. Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network. 2024.

MLA (9th ed.) Citation

Bao, Yin-Yin, et al. Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network. 2024.