Luo, H., Yu, X., Zhang, S., Xia, J., Jian, Y., Sun, Y., . . . Feng, Z. (2024). SEW: Self-calibration Enhanced Whole Slide Pathology Image Analysis.
Cita Chicago Style (17a ed.)Luo, Haoming, et al. SEW: Self-calibration Enhanced Whole Slide Pathology Image Analysis. 2024.
Cita MLA (9a ed.)Luo, Haoming, et al. SEW: Self-calibration Enhanced Whole Slide Pathology Image Analysis. 2024.
Precaución: Estas citas no son 100% exactas.