APA (7th ed.) Citation

MacLaren, I., Silinga, A., Barthel, J., Kleibeuker, J., MacManus-Driscoll, J. L., Allen, C. S., & Kirkland, A. I. (2024). Atomic resolution imaging of the strength and 3D direction of atomic displacements in functional oxide thin films.

Chicago Style (17th ed.) Citation

MacLaren, Ian, Aurys Silinga, Juri Barthel, Josee Kleibeuker, Judith L. MacManus-Driscoll, Christopher S. Allen, and Angus I. Kirkland. Atomic Resolution Imaging of the Strength and 3D Direction of Atomic Displacements in Functional Oxide Thin Films. 2024.

MLA (9th ed.) Citation

MacLaren, Ian, et al. Atomic Resolution Imaging of the Strength and 3D Direction of Atomic Displacements in Functional Oxide Thin Films. 2024.