APA (7th ed.) Citation

Zhang, Y., Baker, B., Chen, S., Zhang, C., Huang, Y., Zhao, Q., & Bom, S. (2025). Detecting Defective Wafers Via Modular Networks.

Chicago Style (17th ed.) Citation

Zhang, Yifeng, Bryan Baker, Shi Chen, Chao Zhang, Yu Huang, Qi Zhao, and Sthitie Bom. Detecting Defective Wafers Via Modular Networks. 2025.

MLA (9th ed.) Citation

Zhang, Yifeng, et al. Detecting Defective Wafers Via Modular Networks. 2025.