Guerguis, B., Cuduvally, R., Ost, A., Ghorbani, M., Rashid, S., Machado, W., . . . Bassim, N. (2025). Multi-Length-Scale Dopants Analysis of an Image Sensor via Focused Ion Beam-Secondary Ion Mass Spectrometry and Atom Probe Tomography.
Style de citation Chicago (17e éd.)Guerguis, Bavley, et al. Multi-Length-Scale Dopants Analysis of an Image Sensor via Focused Ion Beam-Secondary Ion Mass Spectrometry and Atom Probe Tomography. 2025.
Style de citation MLA (9e éd.)Guerguis, Bavley, et al. Multi-Length-Scale Dopants Analysis of an Image Sensor via Focused Ion Beam-Secondary Ion Mass Spectrometry and Atom Probe Tomography. 2025.
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