Wei, Y., Wan, Z., Crafton, B., Spetalnick, S., & Raychowdhury, A. (2025). Characterization and Mitigation of ADC Noise by Reference Tuning in RRAM-Based Compute-In-Memory.
Chicago Style (17th ed.) CitationWei, Ying-Hao, Zishen Wan, Brian Crafton, Samuel Spetalnick, and Arijit Raychowdhury. Characterization and Mitigation of ADC Noise by Reference Tuning in RRAM-Based Compute-In-Memory. 2025.
MLA (9th ed.) CitationWei, Ying-Hao, et al. Characterization and Mitigation of ADC Noise by Reference Tuning in RRAM-Based Compute-In-Memory. 2025.
Warning: These citations may not always be 100% accurate.